| Year of Publication |
2017
|
| Journal |
Science of Advanced Materials
|
| Volume |
9
|
| Number of Pages |
199–205
|
| Download citation |
Publications
Correlation of structural, morphological, electrical and mechanical properties of TiN thin film at different substrate bias
Professor of Chemistry
Citation: Correlation of structural, morphological, electrical and mechanical properties of TiN thin film at different substrate bias. Science of Advanced Materials. 2017;9:199–205.
In: Science of Advanced Materials
Published by: American Scientific Publishers , 2017
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